胡正明（Chenming Hu）弟子

辰羲

Ph.D. Dissertations - Chenming Hu
Compact Modeling of Advanced CMOS and Emerging Devices for Circuit Simulation
Yen-Kai Lin [2019]

Mathematical Compact Models of Advanced Transistors for Numerical Simulation and Hardware Design
Juan Duarte [2018]

Steep On/Off Transistors for Future Low Power Electronics
Chun Wing Yeung [2014]

From Poisson to Silicon - Advancing Compact SPICE Models for IC Design
Sriramkumar Venugopalan [2013]

Band-to-Band Tunnel Transistor Design and Modeling for Low Power Applications
Kanghoon Jeon [2012]

Improving CMOS Speed and Switching Power with Air-gap Structures
Jemin Park [2011]

PhD Dissertation: Compact Models for Future Generation CMOS
Darsen Lu [2011]

Low Power Band to Band Tunnel Transistors
Anupama Bowonder [2010]

Steep Turn On/Off "Green" Tunnel Transistors
Pratik Ashvin Patel [2010]

Compact Modeling of Nanoscale CMOS
Chung-Hsun Lin [2007]

Advanced Materials and Structures for Nanoscale CMOS Devices
Daewon Ha [2004]

Nanoscale Thin-Body CMOS Devices
Leland Chang [2003]

Advanced Compact Modeling of MOSFETs
Kanyu Cao [2002]

Advanced Gate Stack Materials and Processes for Sub-100nm CMOS Appliciations
Qiang Lu [2002]

An International Standard Model for SOI Circuit Design
Pin Su [2002]

Characterization and Modeling of Advanced Gate Dielectrics
Kevin J. Yang [2002]

Gate Stack for Sub-50nm CMOS Devices: Materials, Engineering, and Modeling
Igor Polishchuk [2002]

Gate-Stack and Channel Engineering for Advanced CMOS Technology
Yee-Chia Yeo [2002] 新加坡国立大学教授

Nanometer Circuit Performance Analysis: Device and Interconnect
Yu Cao [2002]

Scaling CMOS Memories
Charles C. Kuo [2002]

Dynamic Threshold MOSFETs for Future Integrated Circuits
Stephen H. S. Tang [2001]

High-Frequency MOSFET Modeling for RF Applications
Xiaodong Jin [2001]

Nanofabrication Technologies and Novel Device Structures for Nanoscale CMOS
Yang Kyu Choi [2001]

Process Development and Device Design for Continued MOSFET Scaling
Nick Lindert [2001]

Statistical Models, Methods, and Algorithms for Computer-Aided Design for Manufacturing
Michael E. Orshansky [2001]

Analytical Modeling and Characterization of Deep-Submicron Interconnect
Dennis M. Sylvester [1999]

Poly-Silicon-Germanium Gate Technology and Direct Tunneling Oxide for Deep-Submicron CMOS Application
Wen-Chin Lee [1999]

Thermal Effects in Deep Sub-Micron VLSI Interconnects and Implications for Reliability and Performance
Kaustav Banerjee [1999]

Thin Dielectric Technology and Memory Devices
Ya-Chin King [1999]

Analytical and Compact Models (BSIM3v3) for Deep Submicron CMOS
Kai Chen [1998]

Hot-Carrier Reliability of CMOS Integrated Circuits
Jone F. Chen [1998]

Hot-Carrier Reliability Simulation and Verification
Bruce W. McGaughy [1998]

Plasma Process-Induced Charging Damage on Thin Gate Oxides
Donggun Park [1998]

Separation by Plasma Implantation of Oxygen with Plasma Immersion Ion Implantation to Form Silicon-on-Insulator
S. Sundar Kumar Iyer [1998]

Statistical Modeling of MOSFETs and Interconnects for Deep-Submicron Technologies
James C.-T. Chen [1998]

MOSFET Technology for Ultra-Large-Scale Integration
Bin Yu [1997] 俞滨 浙江大学教授，IEEE Fellow。曾任美国AMD公司高级研究员，美国航天局（NASA）纳米研究中心资深研究员，美国纽约州立大学纳米科学与工程学院终身教授。

Physics of Future Very Large Scale Integration (VLSI) MOSFETs
Dennis Sinitsky [1997]

Advanced MOSFET Devices for VLSI Memory and Logic
Hsing-Jen C. Wann [1996]

Design Aids Linking Manufacturing and Technology with IC Design
Robert H. Tu [1996]

VLSI Gate Oxide Reliability
Chih-chieh King [1996]

Modeling and Characterization of Electromigration Failures in IC Metallization Systems and Copper Metallization for ULSI Application
Jiang Tao [1995]

Deep Sub-Micrometer Silicon-on-Insulator (SOI) MOSFETs
Fariborz Assaderaghi [1994]

Low Voltage Silicon Dioxide Reliability
Klaus F. Schuegraf [1994]

Reliability Simulation of Digital CMOS VLSI Circuits
Eric R. Minami [1994]

Hot-Carrier Reliability of Integrated Circuits
Khandker N. Quader [1993]

Thin Oxide Damage by Plasma Processing
Hyungcheol Shin [1993]

Silicon-on-Insulator (SOI) MOSFETs
Jian Chen [1992]

Thin Oxide Reliability in Integrated Circuits
Elyse Rosenbaum [1992]

Ferroelectric PZT Thin Films for Semiconductor Memory
Reza Moazzami [1991]

Device Design for High-Speed Deep-Submicrometer MOS Technology
James E. Moon [1990]

Device Models for the Gallium Arsenide MESFET
Peter George [1990]

High-Voltage and Power Semiconductor Devices
David Giandomenico [1990]

Hot-Carrier Reliability of Bipolar Transistors and Circuits
James D. Burnett [1990]

Performance and Reliability Design Issues for Deep-Submicrometer MOSFETs
James E. Chung [1990]

Reliability of Electrostatic Discharge (ESD) Protection Devices and Circuits
Yupin K. Fong [1990]

Advanced Techniques for CMOS Performance Enhancement and Latch-Up Control
Hans P. Zappe [1989]

High Field Reliability of MOS Devices
Jack C.-Y. Lee [1988]

MOS Transistor Modeling and Characterization for Circuit Simulation
Bing J. Sheu [1985]

Hot-Carrier Effects in p-MOSFETs
Tong-Chern Ong [1988]

Advanced MOSFET Technologies for High Speed Circuits and EPROM
Albert T.-T. Wu [1987]

Hot-Electron Effects in VLSI MOSFET's
Tung-Yi P. Chan [1987]

MOSFET Performance Degradation Due to Hot Carriers
Jeong Y. Choi [1987]

Electrical Breakdown of Thin Gate and Tunneling Oxides
Ih-Chin Chen [1986]

Power Bipolar-MOS Transistor
Di-Son Kuo [1986]

Studies of Electrical Breakdown in Thin Films of Silicon-Dioxide
Stephen E. Holland [1986]

CMOS Latch-Up Modeling and Prevention
Kyle W. Terrill [1985]

Current, Field Stress-Induced Degradation in Thin Gate-Oxide MOSFETs
Mong-Song Liang [1984]  梁孟松博士，中芯国际联合CEO，曾于1992年至2009年在台湾集成电路制造股份有限公司担任资深研发处长, 2011-2017年任职三星。

Hot-Electron Effects in Silicon MOSFETs: An Experimental and Correlation Study
Simon M.-K. Tam [1984]

A Model for Laser Melting of Polycrystalline Silicon in Multilayer Structures
Clifford I. Drowley [1982]

Power MOSFETs
Min-hwa Chi [1982] 季明华博士，芯恩 (青岛) 集成电路 (2018 )资深副总。曾工作于Intel (1982-1989); KFI 技术（1989-1994），美国国家半导体 (1994-1997); 台湾积体电路Tsmc (1997-2005)任资深研发总监; GLOBAL-FOUNDRIES (2011-2015) 任资深技术专家/总监; 中芯国际（2006-2011, 2015-2018）。